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Open AccessArticle

Experimental Verification of the Pumping Effect Caused by the Micro-Tapered Hole in a Piezoelectric Atomizer

1
School of Mechanical and Electric Engineering, Guangzhou University, Guangzhou 510006, China
2
State Key Laboratory of Mechanics and Control of Mechanical Structures, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, China
3
Research Center of Fluid Machinery Engineering and Technology, Jiangsu University, Zhenjiang 212013, China
4
College of Mechanical Engineering and Automation, Zhejiang Sci-Tech University, Hangzhou 310018, China
*
Author to whom correspondence should be addressed.
Sensors 2018, 18(7), 2311; https://doi.org/10.3390/s18072311
Received: 20 June 2018 / Revised: 11 July 2018 / Accepted: 15 July 2018 / Published: 17 July 2018
(This article belongs to the Special Issue Recent Advances of Piezoelectric Transducers and Applications)
In this study, we examined the use of a dynamic micro-tapered hole as a micro-scale tapered flow tube valveless piezoelectric pump. Firstly, we obtained photographs of a micro-tapered hole by using an environmental scanning electron microscope (ESEM). Then, we explained the pump effect of the micro-tapered hole, and derived the atomization rate equation. Furthermore, we reported an atomization rate measurement experiment that eliminated the atomization caused by a pressure increase, and demonstrated that a change in the volume of a micro-tapered hole could produce atomization. The experimental results indicate that, under the same voltage, the forward atomization rate is much higher than the reverse atomization rate and that the atomization rate increases with the micro-tapered hole volume. The experimental results show that the atomization of the micro-tapered aperture atomizer is caused by its pumping effect. Moreover, the flow resistance and volume of the micro-tapered hole can affect the atomization rate. View Full-Text
Keywords: micro-tapered aperture; pumping effect; atomization rate micro-tapered aperture; pumping effect; atomization rate
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MDPI and ACS Style

Zhang, J.; Yan, Q.; Huang, J.; Wu, C. Experimental Verification of the Pumping Effect Caused by the Micro-Tapered Hole in a Piezoelectric Atomizer. Sensors 2018, 18, 2311. https://doi.org/10.3390/s18072311

AMA Style

Zhang J, Yan Q, Huang J, Wu C. Experimental Verification of the Pumping Effect Caused by the Micro-Tapered Hole in a Piezoelectric Atomizer. Sensors. 2018; 18(7):2311. https://doi.org/10.3390/s18072311

Chicago/Turabian Style

Zhang, Jianhui; Yan, Qiufeng; Huang, Jun; Wu, Chuanyu. 2018. "Experimental Verification of the Pumping Effect Caused by the Micro-Tapered Hole in a Piezoelectric Atomizer" Sensors 18, no. 7: 2311. https://doi.org/10.3390/s18072311

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