Becquaert, M.; Cristofani, E.; Van Luong, H.; Vandewal, M.; Stiens, J.; Deligiannis, N.
Compressed Sensing mm-Wave SAR for Non-Destructive Testing Applications Using Multiple Weighted Side Information. Sensors 2018, 18, 1761.
https://doi.org/10.3390/s18061761
AMA Style
Becquaert M, Cristofani E, Van Luong H, Vandewal M, Stiens J, Deligiannis N.
Compressed Sensing mm-Wave SAR for Non-Destructive Testing Applications Using Multiple Weighted Side Information. Sensors. 2018; 18(6):1761.
https://doi.org/10.3390/s18061761
Chicago/Turabian Style
Becquaert, Mathias, Edison Cristofani, Huynh Van Luong, Marijke Vandewal, Johan Stiens, and Nikos Deligiannis.
2018. "Compressed Sensing mm-Wave SAR for Non-Destructive Testing Applications Using Multiple Weighted Side Information" Sensors 18, no. 6: 1761.
https://doi.org/10.3390/s18061761
APA Style
Becquaert, M., Cristofani, E., Van Luong, H., Vandewal, M., Stiens, J., & Deligiannis, N.
(2018). Compressed Sensing mm-Wave SAR for Non-Destructive Testing Applications Using Multiple Weighted Side Information. Sensors, 18(6), 1761.
https://doi.org/10.3390/s18061761