Next Article in Journal
Knowledge-Based Query Construction Using the CDSS Knowledge Base for Efficient Evidence Retrieval
Next Article in Special Issue
A Long Distance Phase-Sensitive Optical Time Domain Reflectometer with Simple Structure and High Locating Accuracy
Previous Article in Journal
Development of a Small-Sized, Flexible, and Insertable Fiber-Optic Radiation Sensor for Gamma-Ray Spectroscopy
Previous Article in Special Issue
The Thermoluminescence Response of Ge-Doped Flat Fibers to Gamma Radiation
Article Menu

Export Article

Open AccessArticle
Sensors 2015, 15(9), 21280-21293;

A Ratiometric Wavelength Measurement Based on a Silicon-on-Insulator Directional Coupler Integrated Device

Photonic Research Centre, Dublin Institute of Technology, Kevin Street, Dublin 8, Ireland
Optoelectronics Research Centre, University of Southampton, Southampton SO17 1BJ, UK
Department of Engineering Physics, Faculty of Industrial Technology, Institut Teknologi Sepuluh Nopember, Surabaya, Sukolilo 60111, Indonesia
Key laboratory of In-fiber Integrated Optics of Ministry of Education, College of Science, Harbin Engineering University, Harbin 150001, China
State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
Authors to whom correspondence should be addressed.
Academic Editor: Vittorio M. N. Passaro
Received: 29 May 2015 / Revised: 13 August 2015 / Accepted: 24 August 2015 / Published: 28 August 2015
(This article belongs to the Special Issue Silicon Based Optical Sensors)
Full-Text   |   PDF [1194 KB, uploaded 28 August 2015]   |  


A ratiometric wavelength measurement based on a Silicon-on-Insulator (SOI) integrated device is proposed and designed, which consists of directional couplers acting as two edge filters with opposite spectral responses. The optimal separation distance between two parallel silicon waveguides and the interaction length of the directional coupler are designed to meet the desired spectral response by using local supermodes. The wavelength discrimination ability of the designed ratiometric structure is demonstrated by a beam propagation method numerically and then is verified experimentally. The experimental results have shown a general agreement with the theoretical models. The ratiometric wavelength system demonstrates a resolution of better than 50 pm at a wavelength around 1550 nm with ease of assembly and calibration. View Full-Text
Keywords: directional coupler; wavelength monitor; integrated optics directional coupler; wavelength monitor; integrated optics

Figure 1

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (CC BY 4.0).

Share & Cite This Article

MDPI and ACS Style

Wang, P.; Hatta, A.M.; Zhao, H.; Zheng, J.; Farrell, G.; Brambilla, G. A Ratiometric Wavelength Measurement Based on a Silicon-on-Insulator Directional Coupler Integrated Device. Sensors 2015, 15, 21280-21293.

Show more citation formats Show less citations formats

Related Articles

Article Metrics

Article Access Statistics



[Return to top]
Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top