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Journal: Sensors, 2014
Volume: 14
Number: 1132

Article: A Non-Intrusive Method for Monitoring the Degradation of MOSFETs
Authors: by Li-Feng Wu, Yu Zheng, Yong Guan, Guo-Hui Wang and Xiao-Juan Li
Link: https://www.mdpi.com/1424-8220/14/1/1132

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