Next Article in Journal
The Potential for Harvesting Energy from the Movement of Trees
Previous Article in Journal
Design of a Covert RFID Tag Network for Target Discovery and Target Information Routing
Article Menu

Export Article

Open AccessArticle
Sensors 2011, 11(10), 9260-9274;

Analysis of Deflection Enhancement Using Epsilon Assembly Microcantilevers Based Sensors

Thermal Engineering and Desalination Technology Department, King Abdulaziz University, P.O. 80204, Jeddah 21589, Saudi Arabia
Mechanical Engineering Department, University of California, Riverside, CA 92521, USA
Author to whom correspondence should be addressed.
Received: 23 August 2011 / Revised: 21 September 2011 / Accepted: 23 September 2011 / Published: 28 September 2011
(This article belongs to the Section Physical Sensors)
Full-Text   |   PDF [356 KB, uploaded 21 June 2014]


The present work analyzes theoretically and verifies the advantage of utilizing ε-microcantilever assemblies in microsensing applications. The deflection profile of these innovative ε-assembly microcantilevers is compared with that of the rectangular microcantilever and modified triangular microcantlever. Various force-loading conditions are considered. The theorem of linear elasticity for thin beams is used to obtain the deflections. The obtained defections are validated against an accurate numerical solution utilizing finite element method with maximum deviation less than 10 percent. It is found that the ε-assembly produces larger deflections than the rectangular microcantilever under the same base surface stress and same extension length. In addition, the ε-microcantilever assembly is found to produce larger deflection than the modified triangular microcantilever. This deflection enhancement is found to increase as the ε-assembly’s free length decreases for various types of force loading conditions. Consequently, the ε-microcantilever is shown to be superior in microsensing applications as it provides favorable high detection capability with a reduced susceptibility to external noises. Finally, this work paves a way for experimentally testing the ε-assembly to show whether detective potential of microsensors can be increased. View Full-Text
Keywords: microcantilever; assembly; detection; deflection; enhancement microcantilever; assembly; detection; deflection; enhancement
This is an open access article distributed under the Creative Commons Attribution License (CC BY 3.0).

Share & Cite This Article

MDPI and ACS Style

Khaled, A.-R.A.; Vafai, K. Analysis of Deflection Enhancement Using Epsilon Assembly Microcantilevers Based Sensors. Sensors 2011, 11, 9260-9274.

Show more citation formats Show less citations formats

Related Articles

Article Metrics

Article Access Statistics



[Return to top]
Sensors EISSN 1424-8220 Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top