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Journal: Int. J. Mol. Sci., 2013
Volume: 14
Number: 16706
Article:
Using Synchrotron Radiation-Based Infrared Microspectroscopy to Reveal Microchemical Structure Characterization: Frost Damaged Wheat vs. Normal Wheat
Authors:
by
Hangshu Xin, Xuewei Zhang and Peiqiang Yu
Link:
https://www.mdpi.com/1422-0067/14/8/16706
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