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Article

Growth and Characterization of Graphene Layers on Different Kinds of Copper Surfaces

1
Institute of Solid State Physics, Bulgarian Academy of Sciences, 72 Tzarigradsko Chaussee Blvd., 1784 Sofia, Bulgaria
2
Institute of General and Inorganic Chemistry, Bulgarian Academy of Sciences, Acad. G. Bonchev Str., bl. 11, 1113 Sofia, Bulgaria
3
Department of Solid State Physics, Faculty of Sciences and Technology, University of Debrecen, P.O. Box 400, H-4002 Debrecen, Hungary
4
Department of Inorganic and Analytical Chemistry, Budapest University of Technology and Economics, Muegyetem rakpart 3, H-1111 Budapest, Hungary
*
Author to whom correspondence should be addressed.
Academic Editors: Crina Socaci, Mihaela Diana Lazar and Maria Mihet
Molecules 2022, 27(6), 1789; https://doi.org/10.3390/molecules27061789
Received: 2 January 2022 / Revised: 26 February 2022 / Accepted: 7 March 2022 / Published: 9 March 2022
(This article belongs to the Special Issue Recent Progress of Graphene-Based Composites in Europe)
Graphene films were grown by chemical vapor deposition on Cu foil. The obtained samples were characterized by Raman spectroscopy, ellipsometry, X-ray photoelectron spectroscopy and electron back-scatter diffraction. We discuss the time-dependent changes in the samples, estimate the thickness of emerging Cu2O beneath the graphene and check the orientation-dependent affinity to oxidation of distinct Cu grains, which also governs the manner in which the initial strong Cu-graphene coupling and strain in the graphene lattice is released. Effects of electropolishing on the quality and the Raman response of the grown graphene layers are studied by microtexture polarization analysis. The obtained data are compared with the Raman signal of graphene after transfer on glass substrate revealing the complex interaction of graphene with the Cu substrate. View Full-Text
Keywords: graphene; chemical vapor deposition; Raman spectroscopy; X-ray photoelectron spectroscopy; ellipsometry; electron backscatter diffraction graphene; chemical vapor deposition; Raman spectroscopy; X-ray photoelectron spectroscopy; ellipsometry; electron backscatter diffraction
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MDPI and ACS Style

Rafailov, P.M.; Sveshtarov, P.K.; Mehandzhiev, V.B.; Avramova, I.; Terziyska, P.; Petrov, M.; Katranchev, B.; Naradikian, H.; Boyadjiev, S.I.; Cserháti, C.; Erdélyi, Z.; Szilágyi, I.M. Growth and Characterization of Graphene Layers on Different Kinds of Copper Surfaces. Molecules 2022, 27, 1789. https://doi.org/10.3390/molecules27061789

AMA Style

Rafailov PM, Sveshtarov PK, Mehandzhiev VB, Avramova I, Terziyska P, Petrov M, Katranchev B, Naradikian H, Boyadjiev SI, Cserháti C, Erdélyi Z, Szilágyi IM. Growth and Characterization of Graphene Layers on Different Kinds of Copper Surfaces. Molecules. 2022; 27(6):1789. https://doi.org/10.3390/molecules27061789

Chicago/Turabian Style

Rafailov, Peter M., Peter K. Sveshtarov, Vladimir B. Mehandzhiev, Ivalina Avramova, Penka Terziyska, Minko Petrov, Boyko Katranchev, Haritun Naradikian, Stefan I. Boyadjiev, Csaba Cserháti, Zoltán Erdélyi, and Imre M. Szilágyi. 2022. "Growth and Characterization of Graphene Layers on Different Kinds of Copper Surfaces" Molecules 27, no. 6: 1789. https://doi.org/10.3390/molecules27061789

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