The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO2 Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect
Abstract
:1. Introduction
2. Results and Discussion
3. Materials and Methods
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
References
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Sample | Lattice Parameter (Å) | |
---|---|---|
a | c | |
0.5% CoNTO powder | 4.596 | 2.962 |
1% CoNTO powder | 4.596 | 2.962 |
0.5% CoNTO ceramic | 4.593 | 2.960 |
1% CoNTO ceramic | 4.595 | 2.961 |
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Nachaithong, T.; Chanlek, N.; Moontragoon, P.; Thongbai, P. The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO2 Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect. Molecules 2021, 26, 3230. https://doi.org/10.3390/molecules26113230
Nachaithong T, Chanlek N, Moontragoon P, Thongbai P. The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO2 Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect. Molecules. 2021; 26(11):3230. https://doi.org/10.3390/molecules26113230
Chicago/Turabian StyleNachaithong, Theeranuch, Narong Chanlek, Pairot Moontragoon, and Prasit Thongbai. 2021. "The Primary Origin of Excellent Dielectric Properties of (Co, Nb) Co-Doped TiO2 Ceramics: Electron-Pinned Defect Dipoles vs. Internal Barrier Layer Capacitor Effect" Molecules 26, no. 11: 3230. https://doi.org/10.3390/molecules26113230