Fawzy, A.; Fledderus, H.; Shen, J.; Manders, W.H.; Verstegen, E.; Akkerman, H.B.
Highly Selective Laser Ablation for Thin-Film Electronics: Overcoming Variations Due to Minute Optical Path Length Differences in Plastic Substrates. J. Exp. Theor. Anal. 2025, 3, 38.
https://doi.org/10.3390/jeta3040038
AMA Style
Fawzy A, Fledderus H, Shen J, Manders WH, Verstegen E, Akkerman HB.
Highly Selective Laser Ablation for Thin-Film Electronics: Overcoming Variations Due to Minute Optical Path Length Differences in Plastic Substrates. Journal of Experimental and Theoretical Analyses. 2025; 3(4):38.
https://doi.org/10.3390/jeta3040038
Chicago/Turabian Style
Fawzy, Ahmed, Henri Fledderus, Jie Shen, Wiel H. Manders, Emile Verstegen, and Hylke B. Akkerman.
2025. "Highly Selective Laser Ablation for Thin-Film Electronics: Overcoming Variations Due to Minute Optical Path Length Differences in Plastic Substrates" Journal of Experimental and Theoretical Analyses 3, no. 4: 38.
https://doi.org/10.3390/jeta3040038
APA Style
Fawzy, A., Fledderus, H., Shen, J., Manders, W. H., Verstegen, E., & Akkerman, H. B.
(2025). Highly Selective Laser Ablation for Thin-Film Electronics: Overcoming Variations Due to Minute Optical Path Length Differences in Plastic Substrates. Journal of Experimental and Theoretical Analyses, 3(4), 38.
https://doi.org/10.3390/jeta3040038
