Article Versions Notes

Kahatapitiya NS, Kalupahana D, Mohamed H, Silva BN, Wijenayake U, Han S, Seong D, Jeon M, Kim J, Wijesinghe RE. Detection of Peak Intensity Using an Integrated Optical Modeling Method for Identifying Defective Apple Leaves. Engineering Proceedings. 2024; 82(1):45. https://doi.org/10.3390/ecsa-11-20515

Kahatapitiya, Nipun Shantha, Deshan Kalupahana, Hana Mohamed, Bhagya Nathali Silva, Udaya Wijenayake, Sangyeob Han, Daewoon Seong, Mansik Jeon, Jeehyun Kim, and Ruchire Eranga Wijesinghe. 2024. "Detection of Peak Intensity Using an Integrated Optical Modeling Method for Identifying Defective Apple Leaves" Engineering Proceedings 82, no. 1: 45. https://doi.org/10.3390/ecsa-11-20515

Kahatapitiya, N. S., Kalupahana, D., Mohamed, H., Silva, B. N., Wijenayake, U., Han, S., Seong, D., Jeon, M., Kim, J., & Wijesinghe, R. E. (2024). Detection of Peak Intensity Using an Integrated Optical Modeling Method for Identifying Defective Apple Leaves. Engineering Proceedings, 82(1), 45. https://doi.org/10.3390/ecsa-11-20515