Valdoleiros, J.; Akhavan-Safar, A.; Maleki, P.; Videira, P.F.C.; Carbas, R.J.C.; Marques, E.A.S.; Karunamurthy, B.; da Silva, L.F.M.
Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components. Surfaces 2025, 8, 2.
https://doi.org/10.3390/surfaces8010002
AMA Style
Valdoleiros J, Akhavan-Safar A, Maleki P, Videira PFC, Carbas RJC, Marques EAS, Karunamurthy B, da Silva LFM.
Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components. Surfaces. 2025; 8(1):2.
https://doi.org/10.3390/surfaces8010002
Chicago/Turabian Style
Valdoleiros, João, Alireza Akhavan-Safar, Payam Maleki, Pedro F. C. Videira, Ricardo J. C. Carbas, Eduardo A. S. Marques, Bala Karunamurthy, and Lucas F. M. da Silva.
2025. "Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components" Surfaces 8, no. 1: 2.
https://doi.org/10.3390/surfaces8010002
APA Style
Valdoleiros, J., Akhavan-Safar, A., Maleki, P., Videira, P. F. C., Carbas, R. J. C., Marques, E. A. S., Karunamurthy, B., & da Silva, L. F. M.
(2025). Effects of Temperature on the Fracture Response of EMC-Si Interface Found in Multilayer Semiconductor Components. Surfaces, 8(1), 2.
https://doi.org/10.3390/surfaces8010002
