Krishna, M.S.; Machado, P.; Otuka, R.I.; Yahaya, S.W.; Neves dos Santos, F.; Ihianle, I.K.
Plant Leaf Disease Detection Using Deep Learning: A Multi-Dataset Approach. J 2025, 8, 4.
https://doi.org/10.3390/j8010004
AMA Style
Krishna MS, Machado P, Otuka RI, Yahaya SW, Neves dos Santos F, Ihianle IK.
Plant Leaf Disease Detection Using Deep Learning: A Multi-Dataset Approach. J. 2025; 8(1):4.
https://doi.org/10.3390/j8010004
Chicago/Turabian Style
Krishna, Manjunatha Shettigere, Pedro Machado, Richard I. Otuka, Salisu W. Yahaya, Filipe Neves dos Santos, and Isibor Kennedy Ihianle.
2025. "Plant Leaf Disease Detection Using Deep Learning: A Multi-Dataset Approach" J 8, no. 1: 4.
https://doi.org/10.3390/j8010004
APA Style
Krishna, M. S., Machado, P., Otuka, R. I., Yahaya, S. W., Neves dos Santos, F., & Ihianle, I. K.
(2025). Plant Leaf Disease Detection Using Deep Learning: A Multi-Dataset Approach. J, 8(1), 4.
https://doi.org/10.3390/j8010004