The X and Gamma-Ray Imager and Spectrometer Onboard THESEUS—Status and Technological Progresses
Abstract
1. Introduction
2. X and Gamma-Ray Imager and Spectrometer: Heritage and Progresses
2.1. Silicon Drift Detectors
2.2. ORION Front-End and Back-End
- Energy resolution of 434 eV FWHM at 13.7 keV for the X-branch;
- Electronic noise of 44 RMS at room temperature for the X-branch, reduced to 30 RMS at −20 °C;
- Minimum detectable energy thresholds of ∼0.8 keV for X-rays and ∼20 keV for -rays;
- Linearity up to ∼40 keV for the X-processor and up to ∼5.3 MeV for the -processor branches.
2.3. Module Mechanics
- Copper-based flex PCB: using commercially available copper flex technology, this solution employs conventional wire bonding for establishing electrical connections between the ORION-FE and the SDDs.
- Aluminum-based FlexBond Technology: developed at FBK in collaboration with the University of Trento and University of Turin, FlexBond utilizes ultra-thin aluminum-polyimide stacks and a low-material-budget architecture. Electrical interconnections are implemented via single-point Tape Automated Bonding (spTAB), which allows for direct bonding of aluminum traces to ASIC pads, offering enhanced mechanical reliability. This technology is currently patent-pending, declared in the Background Intellectual Property Rights (BIPR).
3. Conclusions
Author Contributions
Funding
Acknowledgments
Conflicts of Interest
References
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| XGIS | ||
|---|---|---|
| Energy band (keV) | 2–150 | 150–10,000 |
| Energy resolution | ≤1200 eV FWHM | ≤6% FWHM |
| at 6 keV | at 600 keV | |
| Timing accuracy | 7 μs | |
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© 2026 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license.
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Mattioli, G.; Labanti, C.; Virgilli, E.; Amati, L.; Campana, R.; Baldazzi, G.; Srivastava, S.; Borciani, E.; Calabretto, P.; Marchesini, E.J.; et al. The X and Gamma-Ray Imager and Spectrometer Onboard THESEUS—Status and Technological Progresses. Particles 2026, 9, 3. https://doi.org/10.3390/particles9010003
Mattioli G, Labanti C, Virgilli E, Amati L, Campana R, Baldazzi G, Srivastava S, Borciani E, Calabretto P, Marchesini EJ, et al. The X and Gamma-Ray Imager and Spectrometer Onboard THESEUS—Status and Technological Progresses. Particles. 2026; 9(1):3. https://doi.org/10.3390/particles9010003
Chicago/Turabian StyleMattioli, Giulia, Claudio Labanti, Enrico Virgilli, Lorenzo Amati, Riccardo Campana, Giuseppe Baldazzi, Smiriti Srivastava, Edoardo Borciani, Paolo Calabretto, Ezequiel J. Marchesini, and et al. 2026. "The X and Gamma-Ray Imager and Spectrometer Onboard THESEUS—Status and Technological Progresses" Particles 9, no. 1: 3. https://doi.org/10.3390/particles9010003
APA StyleMattioli, G., Labanti, C., Virgilli, E., Amati, L., Campana, R., Baldazzi, G., Srivastava, S., Borciani, E., Calabretto, P., Marchesini, E. J., Sharma, A., Demenev, E., Ficorella, F., Novel, D., Pepponi, G., La Rosa, G., Nogara, P., & Sottile, G. (2026). The X and Gamma-Ray Imager and Spectrometer Onboard THESEUS—Status and Technological Progresses. Particles, 9(1), 3. https://doi.org/10.3390/particles9010003

