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Precision Permittivity Measurement for Low-Loss Thin Planar Materials Using Large Coaxial Probe from 1 to 400 MHz

School of Electrical Engineering, Faculty of Engineering, Universiti Teknologi Malaysia, 81310 Skudai, Johor, Malaysia
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J. Manuf. Mater. Process. 2018, 2(4), 81; https://doi.org/10.3390/jmmp2040081
Received: 12 October 2018 / Revised: 23 November 2018 / Accepted: 27 November 2018 / Published: 3 December 2018
This paper focuses on the non-destructive dielectric measurement for low-loss planar materials with a thickness of less than 3 mm using a large coaxial probe with an outer diameter of 48 mm. The aperture probe calibration procedure required only to make a measurement of the half-space air and three offset shorts. The reflection coefficient for the thin material is measured using a Keysight E5071C network analyzer from 0.3 MHz to 650 MHz and then converted to a relative dielectric constant, εr and tangent loss, tan δ via closed form capacitance model and lift-off calibration process. Average measurement error of dielectric constant, Δεr is less than 6% from 1 MHz to 400 MHz and the resolution of loss tangent, tan δ measurement is capable of achieving 10−3. View Full-Text
Keywords: large coaxial probe; thin planar materials; low-loss materials; relative permittivity; reflection coefficient; calibration large coaxial probe; thin planar materials; low-loss materials; relative permittivity; reflection coefficient; calibration
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You, K.Y.; Sim, M.S. Precision Permittivity Measurement for Low-Loss Thin Planar Materials Using Large Coaxial Probe from 1 to 400 MHz. J. Manuf. Mater. Process. 2018, 2, 81.

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