Hubertus, J.; Croce, S.; Neu, J.; Rizzello, G.; Seelecke, S.; Schultes, G.
Influence of Residual Stresses of Sputtered Thin Film Electrodes for Dielectric Elastomer Applications. Proceedings 2020, 64, 2.
https://doi.org/10.3390/IeCAT2020-08492
AMA Style
Hubertus J, Croce S, Neu J, Rizzello G, Seelecke S, Schultes G.
Influence of Residual Stresses of Sputtered Thin Film Electrodes for Dielectric Elastomer Applications. Proceedings. 2020; 64(1):2.
https://doi.org/10.3390/IeCAT2020-08492
Chicago/Turabian Style
Hubertus, Jonas, Sipontina Croce, Julian Neu, Gianluca Rizzello, Stefan Seelecke, and Günter Schultes.
2020. "Influence of Residual Stresses of Sputtered Thin Film Electrodes for Dielectric Elastomer Applications" Proceedings 64, no. 1: 2.
https://doi.org/10.3390/IeCAT2020-08492
APA Style
Hubertus, J., Croce, S., Neu, J., Rizzello, G., Seelecke, S., & Schultes, G.
(2020). Influence of Residual Stresses of Sputtered Thin Film Electrodes for Dielectric Elastomer Applications. Proceedings, 64(1), 2.
https://doi.org/10.3390/IeCAT2020-08492