Temperature Sensors Integrated into a CMOS Image Sensor †
Abstract
1. Introduction
2. Description of the Test System
2.1. Pixels and Tixels
2.2. Readout System
3. Measurements
3.1. Image Sensor
3.2. Temperature Sensors
4. Conclusions
Acknowledgments
Conflicts of Interest
References
- Wang, X. Noise in Sub-Micron CMOS Image Sensors. Ph.D. Thesis, Delft University of Technology, Delft, The Netherlands, 3 November 2008; pp. 46–68. [Google Scholar]
- Baranov, P.S.; Litvin, V.T.; Belous, D.A.; Mantsvetov, A.A. Dark Current of the Solid-State Imagers at High Temperature. In Proceedings of the EIConRus IEEE Conference of Russian, Saint Petersburg, Russia, 1–3 February 2017; pp. 635–638. [Google Scholar]
- Fossum, E.R.; Hondongwa, D.B. A Review of the Pinned Photodiode for CCD and CMOS Image Sensors. IEEE J. Electron Devices Soc. 2014, 2, 33–43. [Google Scholar] [CrossRef] [Scilit]
- Souri, K.; Chae, Y.; Makinwa, K. A CMOS Temperature Sensor with a Voltage-Calibrated Inaccuracy of ±0.15 °C (3σ) from −55 °C to 125 °C. IEEE J. Solid State Circuits 2013, 48, 292–301. [Google Scholar] [CrossRef] [Scilit]
- Meijer, G.C.; Wang, G.; Fruett, F. Temperature Sensors and Voltage References Implemented in CMOS Technology. IEEE Sens. J. 2001, 1, 225–234. [Google Scholar] [CrossRef] [Scilit]





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Abarca, A.; Xie, S.; Markenhof, J.; Theuwissen, A. Temperature Sensors Integrated into a CMOS Image Sensor. Proceedings 2017, 1, 358. https://doi.org/10.3390/proceedings1040358
Abarca A, Xie S, Markenhof J, Theuwissen A. Temperature Sensors Integrated into a CMOS Image Sensor. Proceedings. 2017; 1(4):358. https://doi.org/10.3390/proceedings1040358
Chicago/Turabian StyleAbarca, Accel, Shuang Xie, Jules Markenhof, and Albert Theuwissen. 2017. "Temperature Sensors Integrated into a CMOS Image Sensor" Proceedings 1, no. 4: 358. https://doi.org/10.3390/proceedings1040358
APA StyleAbarca, A., Xie, S., Markenhof, J., & Theuwissen, A. (2017). Temperature Sensors Integrated into a CMOS Image Sensor. Proceedings, 1(4), 358. https://doi.org/10.3390/proceedings1040358
