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Proceeding Paper

Temperature Sensors Integrated into a CMOS Image Sensor †

1
Electronic Instrumentation Laboratory, TU Delft, Delft, The Netherlands
2
Harvest Imaging, Bree, Belgium
*
Author to whom correspondence should be addressed.
Presented at the Eurosensors 2017 Conference, Paris, France, 3–6 September 2017.
Proceedings 2017, 1(4), 358; https://doi.org/10.3390/proceedings1040358
Published: 7 September 2017
(This article belongs to the Proceedings of Proceedings of Eurosensors 2017, Paris, France, 3–6 September 2017)
In this work, a novel approach is presented for measuring relative temperature variations inside the pixel array of a CMOS image sensor itself. This approach can give important information when compensation for dark (current) fixed pattern noise (FPN) is needed. The test image sensor consists of pixels and temperature sensors pixels (=Tixels). The size of the Tixels is 11 μm × 11 μm. Pixels and Tixels are placed next to each other in the active imaging array and use the same readout circuits. The design and the first measurements of the combined image-temperature sensor are presented.
Keywords: pixels; bipolar based temperature sensors; dark current pixels; bipolar based temperature sensors; dark current
MDPI and ACS Style

Abarca, A.; Xie, S.; Markenhof, J.; Theuwissen, A. Temperature Sensors Integrated into a CMOS Image Sensor. Proceedings 2017, 1, 358. https://doi.org/10.3390/proceedings1040358

AMA Style

Abarca A, Xie S, Markenhof J, Theuwissen A. Temperature Sensors Integrated into a CMOS Image Sensor. Proceedings. 2017; 1(4):358. https://doi.org/10.3390/proceedings1040358

Chicago/Turabian Style

Abarca, Accel, Shuang Xie, Jules Markenhof, and Albert Theuwissen. 2017. "Temperature Sensors Integrated into a CMOS Image Sensor" Proceedings 1, no. 4: 358. https://doi.org/10.3390/proceedings1040358

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