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Open AccessArticle

Instrumentation for Simultaneous Non-Destructive Profiling of Refractive Index and Rare-Earth-Ion Distributions in Optical Fiber Preforms

Optoelectronics Research Centre (ORC), University of Southampton B53, Southampton SO17 1BJ, UK
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Instruments 2018, 2(4), 23; https://doi.org/10.3390/instruments2040023
Received: 19 October 2018 / Revised: 1 November 2018 / Accepted: 2 November 2018 / Published: 7 November 2018
(This article belongs to the Special Issue Photonic Devices Instrumentation and Applications)
We present a non-destructive technique for a combined evaluation of refractive index and active-dopant distribution in the same position along a rare-earth-doped optical fiber preform. The method relies on luminescence measurements, analyzed through an optical tomography technique, to define the active dopant distribution and ray-deflection measurements to calculate the refractive index profile. The concurrent evaluation of both the preform refractive index and the active dopant profiles allows for an accurate establishment of the dopant distribution within the optical core region. This combined information is important for the optimization and development of a range of advanced fibers, used, for example, in a high-power fiber lasers and modern spatial-division-multiplexing optical communication systems. In addition, the non-destructive nature allows the technique to be used to identify the most appropriate preform segment, thus increasing fiber yield and reducing development cycles. We demonstrate the technique on an Yb3+-doped aluminosilicate fiber preform and compare it with independent refractive index and active-dopant measurements. This technique will be useful for quality evaluation and optimization of optical fiber preforms and lends itself to advanced instrumentation. View Full-Text
Keywords: optical fiber; profiling technique; refractive-index; active-dopant distribution optical fiber; profiling technique; refractive-index; active-dopant distribution
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    Doi: https://doi.org/10.5258/SOTON/D0701
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MDPI and ACS Style

Vivona, M.; Zervas, M.N. Instrumentation for Simultaneous Non-Destructive Profiling of Refractive Index and Rare-Earth-Ion Distributions in Optical Fiber Preforms. Instruments 2018, 2, 23. https://doi.org/10.3390/instruments2040023

AMA Style

Vivona M, Zervas MN. Instrumentation for Simultaneous Non-Destructive Profiling of Refractive Index and Rare-Earth-Ion Distributions in Optical Fiber Preforms. Instruments. 2018; 2(4):23. https://doi.org/10.3390/instruments2040023

Chicago/Turabian Style

Vivona, Marilena; Zervas, Michalis N. 2018. "Instrumentation for Simultaneous Non-Destructive Profiling of Refractive Index and Rare-Earth-Ion Distributions in Optical Fiber Preforms" Instruments 2, no. 4: 23. https://doi.org/10.3390/instruments2040023

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