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Journal: J. Imaging, 2022
Volume: 8
Number: 268

Article: A Novel Defect Inspection System Using Convolutional Neural Network for MEMS Pressure Sensors
Authors: by Mingxing Deng, Quanyong Zhang, Kun Zhang, Hui Li, Yikai Zhang and Wan Cao
Link: https://www.mdpi.com/2313-433X/8/10/268

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