Sinha, A.; Bliss, M.; Wu, X.; Roy, S.; Gottschalg, R.; Gupta, R.
Cross-Characterization for Imaging Parasitic Resistive Losses in Thin-Film Photovoltaic Modules. J. Imaging 2016, 2, 23.
https://doi.org/10.3390/jimaging2030023
AMA Style
Sinha A, Bliss M, Wu X, Roy S, Gottschalg R, Gupta R.
Cross-Characterization for Imaging Parasitic Resistive Losses in Thin-Film Photovoltaic Modules. Journal of Imaging. 2016; 2(3):23.
https://doi.org/10.3390/jimaging2030023
Chicago/Turabian Style
Sinha, Archana, Martin Bliss, Xiaofeng Wu, Subinoy Roy, Ralph Gottschalg, and Rajesh Gupta.
2016. "Cross-Characterization for Imaging Parasitic Resistive Losses in Thin-Film Photovoltaic Modules" Journal of Imaging 2, no. 3: 23.
https://doi.org/10.3390/jimaging2030023
APA Style
Sinha, A., Bliss, M., Wu, X., Roy, S., Gottschalg, R., & Gupta, R.
(2016). Cross-Characterization for Imaging Parasitic Resistive Losses in Thin-Film Photovoltaic Modules. Journal of Imaging, 2(3), 23.
https://doi.org/10.3390/jimaging2030023