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Characterization of Halogen Bonded Adducts in Solution by Advanced NMR Techniques

Dipartimento di Chimica e Chimica Industriale, Università degli Studi di Pisa, via Giuseppe Moruzzi, 13, 56124 Pisa, Italy
Magnetochemistry 2017, 3(4), 30;
Received: 7 September 2017 / Revised: 16 September 2017 / Accepted: 20 September 2017 / Published: 25 September 2017
(This article belongs to the Special Issue Nuclear Magnetic Resonance Spectroscopy)
In the last 20 years, a huge volume of experimental work into halogen bonding (XB) has been produced. Most of the systems have been characterized by solid state X-ray crystallography, whereas in solution the only routine technique is titration (by using 1H and 19F nuclear magnetic resonance (NMR), infrared (IR), ultraviolet–visible (UV–Vis) or Raman spectroscopies, depending on the nature of the system), with the aim of characterizing the strength of the XB interaction. Unfortunately, titration techniques have many intrinsic limitations and they should be coupled with other, more sophisticated techniques to provide an accurate and detailed description of the geometry and stoichiometry of the XB adduct in solution. This review will show how crucial information about XB adducts can be obtained by advanced NMR techniques, nuclear Overhauser effect-based spectroscopies (NOESY, ROESY, HOESY…) and diffusion NMR techniques (PGSE or DOSY). View Full-Text
Keywords: halogen bonding; supramolecular chemistry; NMR spectroscopy halogen bonding; supramolecular chemistry; NMR spectroscopy
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MDPI and ACS Style

Ciancaleoni, G. Characterization of Halogen Bonded Adducts in Solution by Advanced NMR Techniques. Magnetochemistry 2017, 3, 30.

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