Kim, S.G.; Lee, S.-D.; Lee, W.-M.; Jeong, H.-B.; Yu, N.; Lee, O.-J.; Lee, H.-E.
Effective Tomato Spotted Wilt Virus Resistance Assessment Using Non-Destructive Imaging and Machine Learning. Horticulturae 2025, 11, 132.
https://doi.org/10.3390/horticulturae11020132
AMA Style
Kim SG, Lee S-D, Lee W-M, Jeong H-B, Yu N, Lee O-J, Lee H-E.
Effective Tomato Spotted Wilt Virus Resistance Assessment Using Non-Destructive Imaging and Machine Learning. Horticulturae. 2025; 11(2):132.
https://doi.org/10.3390/horticulturae11020132
Chicago/Turabian Style
Kim, Sang Gyu, Sang-Deok Lee, Woo-Moon Lee, Hyo-Bong Jeong, Nari Yu, Oak-Jin Lee, and Hye-Eun Lee.
2025. "Effective Tomato Spotted Wilt Virus Resistance Assessment Using Non-Destructive Imaging and Machine Learning" Horticulturae 11, no. 2: 132.
https://doi.org/10.3390/horticulturae11020132
APA Style
Kim, S. G., Lee, S.-D., Lee, W.-M., Jeong, H.-B., Yu, N., Lee, O.-J., & Lee, H.-E.
(2025). Effective Tomato Spotted Wilt Virus Resistance Assessment Using Non-Destructive Imaging and Machine Learning. Horticulturae, 11(2), 132.
https://doi.org/10.3390/horticulturae11020132