MDPI and ACS Style
Waldner, F.; Fritz, S.; Di Gregorio, A.; Plotnikov, D.; Bartalev, S.; Kussul, N.; Gong, P.; Thenkabail, P.; Hazeu, G.; Klein, I.; Löw, F.; Miettinen, J.; Dadhwal, V.K.; Lamarche, C.; Bontemps, S.; Defourny, P. A Unified Cropland Layer at 250 m for Global Agriculture Monitoring. Data 2016, 1, 3.
https://doi.org/10.3390/data1010003
AMA Style
Waldner F, Fritz S, Di Gregorio A, Plotnikov D, Bartalev S, Kussul N, Gong P, Thenkabail P, Hazeu G, Klein I, Löw F, Miettinen J, Dadhwal VK, Lamarche C, Bontemps S, Defourny P. A Unified Cropland Layer at 250 m for Global Agriculture Monitoring. Data. 2016; 1(1):3.
https://doi.org/10.3390/data1010003
Chicago/Turabian Style
Waldner, François, Steffen Fritz, Antonio Di Gregorio, Dmitry Plotnikov, Sergey Bartalev, Nataliia Kussul, Peng Gong, Prasad Thenkabail, Gerard Hazeu, Igor Klein, Fabian Löw, Jukka Miettinen, Vinay Kumar Dadhwal, Céline Lamarche, Sophie Bontemps, and Pierre Defourny. 2016. "A Unified Cropland Layer at 250 m for Global Agriculture Monitoring" Data 1, no. 1: 3.
https://doi.org/10.3390/data1010003