Article Versions Notes

Wu Z, Xiong Y, Lei L, Tan W, Tang Z, Deng X, Cheng X, Li T. Sub-5 nm AFM Tip Characterizer Based on Multilayer Deposition Technology. Photonics. 2022; 9(9):665. https://doi.org/10.3390/photonics9090665

Wu, Ziruo, Yingfan Xiong, Lihua Lei, Wen Tan, Zhaohui Tang, Xiao Deng, Xinbin Cheng, and Tongbao Li. 2022. "Sub-5 nm AFM Tip Characterizer Based on Multilayer Deposition Technology" Photonics 9, no. 9: 665. https://doi.org/10.3390/photonics9090665

Wu, Z., Xiong, Y., Lei, L., Tan, W., Tang, Z., Deng, X., Cheng, X., & Li, T. (2022). Sub-5 nm AFM Tip Characterizer Based on Multilayer Deposition Technology. Photonics, 9(9), 665. https://doi.org/10.3390/photonics9090665