Diffraction Losses in a Stack of Diamond X-Ray Lenses

Round 1

Reviewer 1 Report

Comments and Suggestions for Authors

CRLs are common focusing optical devices used in the beamlines of fourth-generation synchrotron radiation sources and hard X-ray free-electron laser facilities. The reviewed manuscript is about the experimental measurement of the glitch effect in CRLs. This effect may lead to a reduction in the transmission efficiency of CRLs and can impact spectroscopic experiments. It is an important work, and the paper explains and measures the glitch effect, separating the glitches produced by different lenses through data processing. The reviewed manuscript also provides assistance on how to avoid intensity instabilities caused by the glitch effect when using CRLs for focusing.

This article is good organized, contains a detailed introduction, theoretical descriptions，experimental measurement，and data process. Some small comments:

 

1.      It is suggested that the discussion section should include information on when it is recommended to use a stack of CRLs made from a single crystal substrate or a stack of individual CRLs.

2.      Cavity-based X-ray free-electron lasers (wavelength scanning is typically not performed) represent a direction in the development of FELs, where CRLs are commonly used for collimating X-ray beams within the cavity. It is recommended to add discussion about the application of CRLs in cavity-based XFELs, for instance, under what circumstances, and which type of CRLs should be used, such as a stack of CRLs made from a single crystal substrate or a stack of individual CRLs.

3.      In spectroscopic experiments, is it possible to use the ion chambers shown in Fig. 2 for online monitoring of the spectrum of a stack of CRLs to mitigate their impact on such experiments?

4.      Small word correction: page 3, line 95 “Where” -> “where”

Author Response

Please find the answers in the attached file (green - our answers, green italic - what was added to the manuscript).

Thank you!

Author Response File: Author Response.pdf

Reviewer 2 Report

Comments and Suggestions for Authors

The manuscript “Diffraction losses in a stack of diamond x-ray lenses” by N. Klimova and A. Snigirev is rather well written and interesting to read. It appears that authors pursue two aims: (1) to introduce an approach for identifying glitches and testing of CRL assemblies (2) to show how such tests can be used to improve accuracy of real experiments, for instance, at diffraction and spectroscopy beamlines. While the former subject, that is the method itself, is presented and discussed satisfactorily (except for the github repository which can hardly be used by anyone due to the lack of basic instructions and comments in the sources), Reviewer feels that conclusions about practical implications and actual usefulness of the presented methodology neither supported well enough nor presented in the appropriate section. Major revisions are recommended. Please see the attached file. 

Comments for author File: Comments.pdf

Author Response

Please find the answers in the attached file (green - our answers, green italic - what was added to the manuscript).

Thank you!

Author Response File: Author Response.pdf

Reviewer 3 Report

Comments and Suggestions for Authors

 

 

 

 

Comments for author File: Comments.pdf

Author Response

Please find the answers in the attached file (green - our answers, green italic - what was added to the manuscript).

Thank you!

Author Response File: Author Response.pdf

Round 2

Reviewer 2 Report

Comments and Suggestions for Authors

Thank you for revising the text. 

Author Response

Thank you once again for your valuable suggestions and comments!

Reviewer 3 Report

Comments and Suggestions for Authors

The revised version of the manuscript fully adapt the suggestions of the previous review. The paper is now improved a lot and very coherent for the reader.

Please check at line 71 the incomplete sentence.

After this minor revision this version can be published in Photonics.

Author Response

Thank you very much for noticing the issue at line 71.

We have corrected - just removed the incomplete sentence.

We have also went through the whole text and corrected a couple small issues.

Thank you once again for your valuable suggestions and comments!