Xuan, C.; Shi, W.; Sun, L.; Wu, J.; Zhang, Y.; Tu, J.
Improved YOLOv9 with Dual Convolution and LSKA Attention for Robust Small Defect Detection in Textiles. Processes 2026, 14, 149.
https://doi.org/10.3390/pr14010149
AMA Style
Xuan C, Shi W, Sun L, Wu J, Zhang Y, Tu J.
Improved YOLOv9 with Dual Convolution and LSKA Attention for Robust Small Defect Detection in Textiles. Processes. 2026; 14(1):149.
https://doi.org/10.3390/pr14010149
Chicago/Turabian Style
Xuan, Chang, Weimin Shi, Lei Sun, Ji Wu, Yongchao Zhang, and Jiajia Tu.
2026. "Improved YOLOv9 with Dual Convolution and LSKA Attention for Robust Small Defect Detection in Textiles" Processes 14, no. 1: 149.
https://doi.org/10.3390/pr14010149
APA Style
Xuan, C., Shi, W., Sun, L., Wu, J., Zhang, Y., & Tu, J.
(2026). Improved YOLOv9 with Dual Convolution and LSKA Attention for Robust Small Defect Detection in Textiles. Processes, 14(1), 149.
https://doi.org/10.3390/pr14010149