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Processes2023, 11(3), 775;https://doi.org/10.3390/pr11030775

Journal: ProcessesVolume: 11Number: 775

Article: PCB Defect Detection Based on Deep Learning Algorithm

Authors:
I-Chun Chen¹,
Rey-Chue Hwang¹ and
Huang-Chu Huang^2,*

Link: https://www.mdpi.com/2227-9717/11/3/775

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