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Journal: Processes, 2023
Volume: 11
Number: 2893

Article: Integration of Bayesian Adaptive Exponentially Weighted Moving Average Control Chart and Paired Ranked-Based Sampling for Enhanced Semiconductor Manufacturing Process Monitoring
Authors: by Botao Liu, Muhammad Noor-ul-Amin, Imad Khan, Emad A. A. Ismail and Fuad A. Awwad
Link: https://www.mdpi.com/2227-9717/11/10/2893

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