Article Versions Notes

Liu B, Noor-ul-Amin M, Khan I, Ismail EAA, Awwad FA. Integration of Bayesian Adaptive Exponentially Weighted Moving Average Control Chart and Paired Ranked-Based Sampling for Enhanced Semiconductor Manufacturing Process Monitoring. Processes. 2023; 11(10):2893. https://doi.org/10.3390/pr11102893

Liu, Botao, Muhammad Noor-ul-Amin, Imad Khan, Emad A. A. Ismail, and Fuad A. Awwad. 2023. "Integration of Bayesian Adaptive Exponentially Weighted Moving Average Control Chart and Paired Ranked-Based Sampling for Enhanced Semiconductor Manufacturing Process Monitoring" Processes 11, no. 10: 2893. https://doi.org/10.3390/pr11102893

Liu, B., Noor-ul-Amin, M., Khan, I., Ismail, E. A. A., & Awwad, F. A. (2023). Integration of Bayesian Adaptive Exponentially Weighted Moving Average Control Chart and Paired Ranked-Based Sampling for Enhanced Semiconductor Manufacturing Process Monitoring. Processes, 11(10), 2893. https://doi.org/10.3390/pr11102893