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Journal: Mathematics, 2023
Volume: 11
Number: 2696
Article:
Carrier Phase Residual Modeling and Fault Monitoring Using Short-Baseline Double Difference and Machine Learning
Authors:
by
Dong-Kyeong Lee, Yebin Lee and Byungwoon Park
Link:
https://www.mdpi.com/2227-7390/11/12/2696
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