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Journal: Technologies, 2022
Volume: 10
Number: 23
Article:
Analysis of the Impact of Electrical and Timing Masking on Soft Error Rate Estimation in VLSI Circuits
Authors:
by
Pelopidas Tsoumanis, Georgios Ioannis Paliaroutis, Nestor Evmorfopoulos and George Stamoulis
Link:
https://www.mdpi.com/2227-7080/10/1/23
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