Article Versions Notes

Hosier A, Dipti, Yang Y, Szypryt P, Mondeel GP, Naing A, Tan JN, Silwal R, O’Neil G, Lapierre A, et al. Background and Blended Spectral Line Reduction in Precision Spectroscopy of EUV and X-ray Transitions in Highly Charged Ions. Atoms. 2023; 11(3):48. https://doi.org/10.3390/atoms11030048

Hosier, Adam, Dipti, Yang Yang, Paul Szypryt, Grant P. Mondeel, Aung Naing, Joseph N. Tan, Roshani Silwal, Galen O’Neil, Alain Lapierre, and et al. 2023. "Background and Blended Spectral Line Reduction in Precision Spectroscopy of EUV and X-ray Transitions in Highly Charged Ions" Atoms 11, no. 3: 48. https://doi.org/10.3390/atoms11030048

Hosier, A., Dipti, Yang, Y., Szypryt, P., Mondeel, G. P., Naing, A., Tan, J. N., Silwal, R., O’Neil, G., Lapierre, A., Blundell, S. A., Gillaspy, J. D., Gwinner, G., Villari, A. C. C., Ralchenko, Y., & Takacs, E. (2023). Background and Blended Spectral Line Reduction in Precision Spectroscopy of EUV and X-ray Transitions in Highly Charged Ions. Atoms, 11(3), 48. https://doi.org/10.3390/atoms11030048