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Journal: J. Open Innov. Technol. Mark. Complex., 2020
Volume: 6
Number: 16
Article:
Measuring Patent Value Indicators with Patent Renewal Information
Authors:
by
Joo Young Og, Krzysztof Pawelec, Byung-Keun Kim, Rafal Paprocki and EuiSeob Jeong
Link:
https://www.mdpi.com/2199-8531/6/1/16
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