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Editorial

Special Issue on “Advanced Technology Related to Radar Signal, Imaging, and Radar Cross-Section Measurement”

by
Hirokazu Kobayashi
1,* and
Toshifumi Moriyama
2
1
Department of Electronics and Information Systems Engineering, Osaka Institute of Technology, Osaka 535-8585, Japan
2
Graduate School of Engineering, Nagasaki University, Nagasaki 852-8521, Japan
*
Author to whom correspondence should be addressed.
Electronics 2020, 9(4), 653; https://doi.org/10.3390/electronics9040653
Submission received: 14 April 2020 / Accepted: 14 April 2020 / Published: 16 April 2020
(This article belongs to the Special Issue Advanced Technology Related to Radar Signal, Imaging, and Radar Cross-Section Measurement)
Versions Notes

1. Introduction

A radar system is made of many elemental and hard/software technologies. Recent applications are expanding to short-distance radars, such as security, nondestructive observation, and aerial monitoring, as well as long-distance radars, such as remote-sensing, surveillance, and weather observation. Further, short-distance radar technology is essential for car sensors in autonomous driving systems. In these various applications, the key technologies supporting radars are essentially the signal, image, and data processing in order to detect a target more explicitly, which includes synthetic aperture imaging (SAR) and inverse-SAR (ISAR), polarimetry, compressive sensing, multiple-input multiple-output (MIMO) processing, and radar beam scanning, in a broad sense. On the other hand, radar cross-section (RCS) evaluation and electromagnetic modeling technologies of radar targets are also important for the development of future smart radars.

2. The Present Issue

This Special Issue [1] focuses on the state-of-the-art investigations on various important radar technologies for future applications. We received many paper submissions for this Special Issue. After a very careful peer-review process, a total of 32 papers were accepted. These works include SAR/ISAR [2,3,4,5,6,7,8,9], polarimetry [10,11,12], MIMO [13,14], direction of arrival (DOA)/direction of departure (DOD) [13,14,15], sparse sensing [5,14,16], ground-penetrating radar (GPR) [17,18,19], through-wall radar [20,21], coherent integration [22,23], clutter suppression [24,25], and meta-materials, among others [26,27,28,29,30,31]. All of these accepted papers are the latest research results and are expected to be further advanced, applied, and diverted. For example, [32] introduces the analytical approach for the development of radio frequency microelectromechanical switches, and [33] explains the comprehensive SAR approach for identifying the scattering mechanisms of radar backscatter caused by vegetated terrains. This Special Issue’s editors hope that these papers attract much attention in the research and development of radar technology.

3. Future

As with many applications, radar-related technology is, of course, also deeply linked to the evolution of computer cluster technology. For example, deep learning technology, which is used for the classification of radar targets, has been significantly advanced and will be applied to many applications we covered in our Special Issue. Although a high-capacity storage and high-speed processor are required, these technologies will create new areas of radar application. Furthermore, the electromagnetic scattering behavior of millimeter waves is different from that of microwaves, and it can be a new research target. The expectation and analysis, or modeling and simulation of hardware and software signals will inevitably require knowledge of electromagnetic field theory. Consequently, the development and research of hardware and software in the radar field will be more active in the future.
The radar-related technology is mainly processed within the time and frequency domains, but at the same time, is a multi-dimensional integrated system including the spatial domain for transmitting and receiving electromagnetic waves. Based on the enormous technological assets of the pioneers, as actively discussed in this Special Issue, research and development in multi-dimensional undeveloped areas are expected to continue.

Author Contributions

H.K. and T.M. worked together in the whole editorial process of the special issue, “Advanced Technology Related to Radar Signal, Imaging, and Radar Cross-Section Measurement” published by journal Electronics. H.K. drafted this editorial summary. H.K. and T.M. reviewed, edited and finalized the manuscript. All authors have read and agreed to the published version of the manuscript.

Acknowledgments

First of all, we would like to appreciate not only all the researchers who submitted articles to this Special Issue for their excellent contributions but also all the reviewers who contributed to the evaluations of scientific merit and quality of the manuscripts. We would like to acknowledge the editorial board of the Electronics journal, who invited us to guest edit this Special Issue. We are also grateful to the Electronics editorial office staff who worked thoroughly to maintain the rigorous peer-review schedule and timely publication.

Conflicts of Interest

The authors declare no conflict of interest.

References

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Share and Cite

MDPI and ACS Style

Kobayashi, H.; Moriyama, T. Special Issue on “Advanced Technology Related to Radar Signal, Imaging, and Radar Cross-Section Measurement”. Electronics 2020, 9, 653. https://doi.org/10.3390/electronics9040653

AMA Style

Kobayashi H, Moriyama T. Special Issue on “Advanced Technology Related to Radar Signal, Imaging, and Radar Cross-Section Measurement”. Electronics. 2020; 9(4):653. https://doi.org/10.3390/electronics9040653

Chicago/Turabian Style

Kobayashi, Hirokazu, and Toshifumi Moriyama. 2020. "Special Issue on “Advanced Technology Related to Radar Signal, Imaging, and Radar Cross-Section Measurement”" Electronics 9, no. 4: 653. https://doi.org/10.3390/electronics9040653

APA Style

Kobayashi, H., & Moriyama, T. (2020). Special Issue on “Advanced Technology Related to Radar Signal, Imaging, and Radar Cross-Section Measurement”. Electronics, 9(4), 653. https://doi.org/10.3390/electronics9040653

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