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Journal: Electronics, 2019
Volume: 8
Number: 501

Article: Analytical Gate Delay Variation Model with Temperature Effects in Near-Threshold Region Based on Log-Skew-Normal Distribution
Authors: by Jingjing Guo, Peng Cao, Jiangping Wu, Zhiyuan Liu and Jun Yang
Link: https://www.mdpi.com/2079-9292/8/5/501

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