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Journal: Electronics, 2019
Volume: 8
Number: 1378

Article: The Relevance of Point Defects in Studying Silica-Based Materials from Bulk to Nanosystems
Authors: by Antonino Alessi, Jochen Kuhnhenn, Gianpiero Buscarino, Diego Di Francesca and Simonpietro Agnello
Link: https://www.mdpi.com/2079-9292/8/12/1378

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