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Journal: Electronics, 2019
Volume: 8
Number: 1365

Article: Microwave Linear Characterization Procedures of On-Wafer Scaled GaAs pHEMTs for Low-Noise Applications
Authors: by Alina Caddemi, Emanuele Cardillo, Giovanni Crupi, Luciano Boglione and Jason Roussos
Link: https://www.mdpi.com/2079-9292/8/11/1365

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