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Journal: Electronics, 2019
Volume: 8
Number: 1339

Article: Effect of the High-Temperature Off-State Stresses on the Degradation of AlGaN/GaN HEMTs
Authors: by Jinfu Lin, Hongxia Liu, Shulong Wang, Chang Liu, Mengyu Li and Lei Wu
Link: https://www.mdpi.com/2079-9292/8/11/1339

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