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Journal: Electronics, 2018
Volume: 7
Number: 427

Article: On the Prediction of the Threshold Voltage Degradation in CMOS Technology Due to Bias-Temperature Instability
Authors: by Alejandro Campos-Cruz, Guillermo Espinosa-Flores-Verdad, Alfonso Torres-Jacome and Esteban Tlelo-Cuautle
Link: https://www.mdpi.com/2079-9292/7/12/427

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