Crupi, G.; Raffo, A.; Vadalà , V.; Vannini, G.; Caddemi, A.
A New Study on the Temperature and Bias Dependence of the Kink Effects in S22 and h21 for the GaN HEMT Technology. Electronics 2018, 7, 353.
https://doi.org/10.3390/electronics7120353
AMA Style
Crupi G, Raffo A, Vadalà V, Vannini G, Caddemi A.
A New Study on the Temperature and Bias Dependence of the Kink Effects in S22 and h21 for the GaN HEMT Technology. Electronics. 2018; 7(12):353.
https://doi.org/10.3390/electronics7120353
Chicago/Turabian Style
Crupi, Giovanni, Antonio Raffo, Valeria Vadalà , Giorgio Vannini, and Alina Caddemi.
2018. "A New Study on the Temperature and Bias Dependence of the Kink Effects in S22 and h21 for the GaN HEMT Technology" Electronics 7, no. 12: 353.
https://doi.org/10.3390/electronics7120353
APA Style
Crupi, G., Raffo, A., Vadalà , V., Vannini, G., & Caddemi, A.
(2018). A New Study on the Temperature and Bias Dependence of the Kink Effects in S22 and h21 for the GaN HEMT Technology. Electronics, 7(12), 353.
https://doi.org/10.3390/electronics7120353