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Journal: Electronics, 2015
Volume: 4
Number: 1090

Article: Analysis of Deep Level Defects in GaN p-i-n Diodes after Beta Particle Irradiation
Authors: by Sofiane Belahsene, Noor Alhuda Al Saqri, Dler Jameel, Abdelmadjid Mesli, Anthony Martinez, Jacques De Sanoit, Abdallah Ougazzaden, Jean Paul Salvestrini, Abderrahim Ramdane and Mohamed Henini
Link: https://www.mdpi.com/2079-9292/4/4/1090

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