Wei, H.; Luh, D.; Chen, Z.; Yan, H.; Zhang, R.
An Intelligent Rehabilitation Assessment Method for Small-Sample Scenarios: Machine Learning Validation Based on Rehabilitation Matching Value. Electronics 2025, 14, 1607.
https://doi.org/10.3390/electronics14081607
AMA Style
Wei H, Luh D, Chen Z, Yan H, Zhang R.
An Intelligent Rehabilitation Assessment Method for Small-Sample Scenarios: Machine Learning Validation Based on Rehabilitation Matching Value. Electronics. 2025; 14(8):1607.
https://doi.org/10.3390/electronics14081607
Chicago/Turabian Style
Wei, Hua, Dingbang Luh, Zihao Chen, Haixia Yan, and Ruizhi Zhang.
2025. "An Intelligent Rehabilitation Assessment Method for Small-Sample Scenarios: Machine Learning Validation Based on Rehabilitation Matching Value" Electronics 14, no. 8: 1607.
https://doi.org/10.3390/electronics14081607
APA Style
Wei, H., Luh, D., Chen, Z., Yan, H., & Zhang, R.
(2025). An Intelligent Rehabilitation Assessment Method for Small-Sample Scenarios: Machine Learning Validation Based on Rehabilitation Matching Value. Electronics, 14(8), 1607.
https://doi.org/10.3390/electronics14081607