Chang, Y.; Xu, X.; Deng, K.; Xu, Y.; Tu, B.; Gao, X.; Wei, Q.
An Analog Circuit Fault Diagnosis Method Incorporating Multi-Objective Selection of Measurement Nodes. Electronics 2025, 14, 1528.
https://doi.org/10.3390/electronics14081528
AMA Style
Chang Y, Xu X, Deng K, Xu Y, Tu B, Gao X, Wei Q.
An Analog Circuit Fault Diagnosis Method Incorporating Multi-Objective Selection of Measurement Nodes. Electronics. 2025; 14(8):1528.
https://doi.org/10.3390/electronics14081528
Chicago/Turabian Style
Chang, Yating, Xianglian Xu, Kaitian Deng, Yuli Xu, Binge Tu, Xinrong Gao, and Qingjie Wei.
2025. "An Analog Circuit Fault Diagnosis Method Incorporating Multi-Objective Selection of Measurement Nodes" Electronics 14, no. 8: 1528.
https://doi.org/10.3390/electronics14081528
APA Style
Chang, Y., Xu, X., Deng, K., Xu, Y., Tu, B., Gao, X., & Wei, Q.
(2025). An Analog Circuit Fault Diagnosis Method Incorporating Multi-Objective Selection of Measurement Nodes. Electronics, 14(8), 1528.
https://doi.org/10.3390/electronics14081528