Ma, M.; Li, C.; Ma, J.; Yang, W.; Li, H.; You, H.; Deen, M.J.
Investigation of Source/Drain Height Variation and Its Impacts on FinFET and GAA Nanosheet FET. Electronics 2025, 14, 1091.
https://doi.org/10.3390/electronics14061091
AMA Style
Ma M, Li C, Ma J, Yang W, Li H, You H, Deen MJ.
Investigation of Source/Drain Height Variation and Its Impacts on FinFET and GAA Nanosheet FET. Electronics. 2025; 14(6):1091.
https://doi.org/10.3390/electronics14061091
Chicago/Turabian Style
Ma, Mingyu, Cong Li, Jianghao Ma, Wangjun Yang, Haokun Li, Hailong You, and M. Jamal Deen.
2025. "Investigation of Source/Drain Height Variation and Its Impacts on FinFET and GAA Nanosheet FET" Electronics 14, no. 6: 1091.
https://doi.org/10.3390/electronics14061091
APA Style
Ma, M., Li, C., Ma, J., Yang, W., Li, H., You, H., & Deen, M. J.
(2025). Investigation of Source/Drain Height Variation and Its Impacts on FinFET and GAA Nanosheet FET. Electronics, 14(6), 1091.
https://doi.org/10.3390/electronics14061091