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Journal: Electronics, 2025
Volume: 14
Number: 830

Article: MRB-YOLOv8: An Algorithm for Insulator Defect Detection
Authors: by Junhong Xu, Shengjie Zhao, Yuan Li, Wenxin Song and Kecheng Zhang
Link: https://www.mdpi.com/2079-9292/14/5/830

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