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Journal: Electronics, 2025
Volume: 14
Number: 830
Article:
MRB-YOLOv8: An Algorithm for Insulator Defect Detection
Authors:
by
Junhong Xu, Shengjie Zhao, Yuan Li, Wenxin Song and Kecheng Zhang
Link:
https://www.mdpi.com/2079-9292/14/5/830
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