Xiao, Y.; Feng, X.; Meng, Y.; He, L.; Zhang, P.; Zhang, D.; Gao, S.; Shields, P.; Tian, H.; Liu, H.
Negative Capacitance Analysis of Multi-Quantum-Well Light-Emitting Diodes. Electronics 2025, 14, 413.
https://doi.org/10.3390/electronics14030413
AMA Style
Xiao Y, Feng X, Meng Y, He L, Zhang P, Zhang D, Gao S, Shields P, Tian H, Liu H.
Negative Capacitance Analysis of Multi-Quantum-Well Light-Emitting Diodes. Electronics. 2025; 14(3):413.
https://doi.org/10.3390/electronics14030413
Chicago/Turabian Style
Xiao, Yang, Xiaoyu Feng, Yuan Meng, Longzhen He, Pengzhe Zhang, Dongyan Zhang, Shoushuai Gao, Philip Shields, Haitao Tian, and Hongwei Liu.
2025. "Negative Capacitance Analysis of Multi-Quantum-Well Light-Emitting Diodes" Electronics 14, no. 3: 413.
https://doi.org/10.3390/electronics14030413
APA Style
Xiao, Y., Feng, X., Meng, Y., He, L., Zhang, P., Zhang, D., Gao, S., Shields, P., Tian, H., & Liu, H.
(2025). Negative Capacitance Analysis of Multi-Quantum-Well Light-Emitting Diodes. Electronics, 14(3), 413.
https://doi.org/10.3390/electronics14030413
