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Modica L, Zagni N, Cioni M, Cappellini G, Giorgino G, Iucolano F, Verzellesi G, Chini A. Impact of OFF-State Stress on Dynamic R_ON of On-Wafer 100 V p-GaN HEMTs, Studied by Emulating Monolithically Integrated Half-Bridge Operation. Electronics. 2025; 14(23):4756. https://doi.org/10.3390/electronics14234756

Modica, Lorenzo, Nicolò Zagni, Marcello Cioni, Giacomo Cappellini, Giovanni Giorgino, Ferdinando Iucolano, Giovanni Verzellesi, and Alessandro Chini. 2025. "Impact of OFF-State Stress on Dynamic R_ON of On-Wafer 100 V p-GaN HEMTs, Studied by Emulating Monolithically Integrated Half-Bridge Operation" Electronics 14, no. 23: 4756. https://doi.org/10.3390/electronics14234756

Modica, L., Zagni, N., Cioni, M., Cappellini, G., Giorgino, G., Iucolano, F., Verzellesi, G., & Chini, A. (2025). Impact of OFF-State Stress on Dynamic R_ON of On-Wafer 100 V p-GaN HEMTs, Studied by Emulating Monolithically Integrated Half-Bridge Operation. Electronics, 14(23), 4756. https://doi.org/10.3390/electronics14234756