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Journal: Electronics, 2025
Volume: 14
Number: 4593
4593
Article: Dynamic Imprint and Recovery Mechanisms in Hf_0.2Zr_0.8O₂ Anti-Ferroelectric Capacitors with FORC Characterization
Authors: by Yuetong Huo, Jianguo Li, Zeping Weng, Yaru Ding, Lijian Chen, Jiabin Qi, Yiming Qu and Yi Zhao
Link: https://www.mdpi.com/2079-9292/14/23/4593

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