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Journal: Electronics, 2025
Volume: 14
Number: 4060
4060
Article: Failure Mechanism Analysis and Electromagnetic Protection Design of Electronic Systems Under High-Power Electromagnetic Pulse
Authors: by Chenxi Huang, Jinhong Wei, Youjie Yan, Kaiyue Zhang, Shoulong Zhang, Yifei Sun and Tongyu Wang
Link: https://www.mdpi.com/2079-9292/14/20/4060

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