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Journal: Electronics, 2025
Volume: 14
Number: 272

Article: A Cross-Cultural Crash Pattern Analysis in the United States and Jordan Using BERT and SHAP
Authors: by Shadi Jaradat, Mohammed Elhenawy, Alexander Paz, Taqwa I. Alhadidi, Huthaifa I. Ashqar and Richi Nayak
Link: https://www.mdpi.com/2079-9292/14/2/272

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