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Journal: Electronics, 2025
Volume: 14
Number: 3861

Article: Channel Temperature Measurement of GaN HEMT Used in Kilowatt-Level Power Amplifier
Authors: by Sheng Zhong, Wenrao Fang, Juan Zhao, Wenhua Huang, Chao Fu, Lulu Wang and Tianwei He
Link: https://www.mdpi.com/2079-9292/14/19/3861

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